Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia.

Author

Uicheul Yoon, Jong-Min Lee, Kiho Im, Yong-Wook Shin, Baek Hwan Cho, In Young Kim, Jun Soo Kwon, Sun I. Kim

Journal

Neuroimage

Vol

34(4)

Page

1405-1415 (2007)

Year

2011~

Link

https://s-space.snu.ac.kr/bitstream/10371/22977/1/Yoon-2007-Pattern%20… 297회 연결